GAAS INTEGRATED-CIRCUITS FOR ERROR-RATE MEASUREMENT IN HIGH-SPEED DIGITAL TRANSMISSION-SYSTEMS

被引：7

作者：

LIECHTI, CA ^{[1
]}

JOLY, R ^{[1
]}

NAMJOO, M ^{[1
]}

机构：

[1] HEWLETT PACKARD LABS, PALO ALTO, CA 94304 USA

来源：

IEEE JOURNAL OF SOLID-STATE CIRCUITS | 1983年 / 18卷 / 04期

关键词：

D O I：

10.1109/JSSC.1983.1051963

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：402 / 408

页数：7

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