CRYOGENIC PIEZOELECTRIC DISPLACEMENT TESTER

被引：6

作者：

YURKE, B

KAMINSKY, PG

EIGLER, DM

机构：

[1] AT&T Bell Lab, Murray Hill, NJ,, USA, AT&T Bell Lab, Murray Hill, NJ, USA

来源：

CRYOGENICS | 1986年 / 26卷 / 07期

关键词：

CERAMIC MATERIALS - Piezoelectric - PIEZOELECTRIC TRANSDUCERS - Low Temperature Effects;

D O I：

10.1016/0011-2275(86)90091-3

中图分类号：

O414.1 [热力学];

学科分类号：

摘要：

A simple apparatus for measuring the displacement of piezoelectric ceramics at cryogenic temperatures is described. We have used this apparatus to measure the voltage-to-displacement conversion of commercial ferroelectric ceramics as a function of temperature from room temperature to liquid helium temperatures.

引用

页码：435 / 436

页数：2