BAND DIAGRAM OF THE POLYCRYSTALLINE CDS/CU(IN,GA)SE-2 HETEROJUNCTION

被引:56
作者
KRONIK, L
BURSTEIN, L
LEIBOVITCH, M
SHAPIRA, Y
GAL, D
MOONS, E
BEIER, J
HODES, G
CAHEN, D
HARISKOS, D
KLENK, R
SCHOCK, HW
机构
[1] WEIZMANN INST SCI, DEPT MAT & INTERFACES, IL-76100 REHOVOT, ISRAEL
[2] UNIV STUTTGART, INST PHYS ELEKTR, D-70589 STUTTGART, GERMANY
关键词
D O I
10.1063/1.114508
中图分类号
O59 [应用物理学];
学科分类号
摘要
Contact potential difference measurements in the dark and under illumination are used to derive the conduction band offset (Delta E(c)) in a solar cell quality junction formed by chemical bath deposition of CdS on a polycrystalline thin film of Cu(In,Ga)Se-2. Our experimental measurements and the estimates made for dipole contributions show that the junction is of type II, i.e., without a spike in the conduction band (Delta E(c) = 80 meV +/- 100 meV). This is consistent with the high performance of the actual solar cell. However, it differs from most previous results on junctions based on single crystals and/or vacuum deposited CdS, which indicated the existence of a conduction band spike. (C) 1995 American Institute of Physics.
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收藏
页码:1405 / 1407
页数:3
相关论文
共 21 条
[1]  
BEIER J, UNPUB
[2]  
BRILLSON LJ, 1979, J VAC SCI TECHNOL, V16, P1137, DOI 10.1116/1.570177
[3]   POLAR LIGAND ADSORPTION CONTROLS SEMICONDUCTOR SURFACE-POTENTIALS [J].
BRUENING, M ;
MOONS, E ;
YARONMARCOVICH, D ;
CAHEN, D ;
LIBMAN, J ;
SHANZER, A .
JOURNAL OF THE AMERICAN CHEMICAL SOCIETY, 1994, 116 (07) :2972-2977
[4]   CHARACTERIZATION OF INTERFACE STATES AT III-V COMPOUND SEMICONDUCTOR-METAL INTERFACES [J].
BURSTEIN, L ;
BREGMAN, J ;
SHAPIRA, Y .
JOURNAL OF APPLIED PHYSICS, 1991, 69 (04) :2312-2316
[5]   STUDIES OF STRUCTURE AND OXYGEN ADSORPTION OF [0001] CDS SURFACES BY LEED [J].
CAMPBELL, BD ;
FARNSWORTH, HE .
SURFACE SCIENCE, 1968, 10 (02) :197-+
[6]  
Capasso F., 1987, HETEROJUNCTION BAND
[7]  
Hedstrom J, 1993, 23 IEEE PHOT SPEC C, P364
[8]  
Kazmerski L. L., 1978, Thirteenth IEEE Photovoltaic Specialists Conference1978, P184
[9]   QUANTITATIVE SURFACE PHOTOVOLTAGE SPECTROSCOPY OF SEMICONDUCTOR INTERFACES [J].
KRONIK, L ;
LEIBOVITCH, M ;
FEFER, E ;
BURSTEIN, L ;
SHAPIRA, Y .
JOURNAL OF ELECTRONIC MATERIALS, 1995, 24 (04) :379-385
[10]   DISTINCTION BETWEEN SURFACE AND BULK STATES IN SURFACE-PHOTOVOLTAGE SPECTROSCOPY [J].
LEIBOVITCH, M ;
KRONIK, L ;
FEFER, E ;
SHAPIRA, Y .
PHYSICAL REVIEW B, 1994, 50 (03) :1739-1745