CORRELATION OF ZONES OF X-RAY INTENSITY DATA FROM COMMON REFLEXIONS

被引:178
作者
RAE, AD
机构
来源
ACTA CRYSTALLOGRAPHICA | 1965年 / 19卷
关键词
D O I
10.1107/S0365110X65004139
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
引用
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页码:683 / &
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[1]   STRUCTURE OF A SILICON CARBIDE POLYTYPE 24R [J].
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ACTA CRYSTALLOGRAPHICA, 1965, 18 :129-&
[2]   THE CORRELATION OF INTERSECTING LAYERS OF X-RAY INTENSITY DATA [J].
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SPARKS, RA .
ACTA CRYSTALLOGRAPHICA, 1960, 13 (03) :273-274
[3]   TO FIT A PLANE OR A LINE TO A SET OF POINTS BY LEAST SQUARES [J].
SCHOMAKER, V ;
WASER, J ;
MARSH, RE ;
BERGMAN, G .
ACTA CRYSTALLOGRAPHICA, 1959, 12 (08) :600-604