COMPUTERIZED METHOD TO DETERMINE CRYSTAL ORIENTATIONS FROM KIKUCHI PATTERNS

被引:48
作者
HEILMANN, P [1 ]
CLARK, WAT [1 ]
RIGNEY, DA [1 ]
机构
[1] OHIO STATE UNIV,COLUMBUS,OH 43210
关键词
D O I
10.1016/0304-3991(82)90097-3
中图分类号
TH742 [显微镜];
学科分类号
摘要
引用
收藏
页码:365 / 371
页数:7
相关论文
共 13 条
[1]   PRECISE DETERMINATION OF RELATIVE ORIENTATION OF 2 CRYSTALS FROM ANALYSIS OF 2 KIKUCHI PATTERNS [J].
BONNET, R ;
DURAND, F .
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1975, 27 (02) :543-549
[2]  
HEILMANN P, UNPUB ORIENTATION DE
[3]  
HIRSCH PB, 1965, ELECTRON MICROSCOPY
[4]  
HOLLINGSWORTH CA, 1967, VECTORS MATRICES GRO
[5]  
KLAFFKE D, 1978, BAM55 BUND MAT FORSC
[6]   THE ESTIMATION OF AN ORIENTATION RELATIONSHIP [J].
MACKENZIE, JK .
ACTA CRYSTALLOGRAPHICA, 1957, 10 (01) :61-62
[7]  
Pumphrey P. H., 1970, Physica Status Solidi A, V2, P339, DOI 10.1002/pssa.19700020222
[8]   ON ACCURACY OF ORIENTATION DETERMINATION BY SELECTED AREA ELECTRON DIFFRACTION [J].
RYDER, PL ;
PITSCH, W .
PHILOSOPHICAL MAGAZINE, 1968, 18 (154) :807-&
[9]   ALTERNATIVE METHOD FOR ANALYZING ORIENTATION RELATIONSHIPS FROM FIELD-ION MICROSCOPE IMAGES [J].
SMITH, DA ;
GORINGE, MJ .
PHILOSOPHICAL MAGAZINE, 1972, 25 (06) :1505-&
[10]   APPLICATIONS OF KIKUCHI LINE ANALYSES IN ELECTRON MICROSCOPY [J].
VONHEIMENDAHL, M ;
THOMAS, G ;
BELL, W .
JOURNAL OF APPLIED PHYSICS, 1964, 35 (12) :3614-&