NEW CONCEPTS FOR CONTROLLED HOMOEPITAXY

被引:72
作者
ROSENFELD, G
LIPKIN, NN
WULFHEKEL, W
KLIEWER, J
MORGENSTERN, K
POELSEMA, B
COMSA, G
机构
[1] UNIV TWENTE, FAC APPL PHYS, 7500 AE ENSCHEDE, NETHERLANDS
[2] UNIV TWENTE, CTR MAT RES, 7500 AE ENSCHEDE, NETHERLANDS
来源
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING | 1995年 / 61卷 / 05期
关键词
D O I
10.1007/BF01540247
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
On the basis of a kinetic growth model we discuss new methods to grow atomically flat homoepitaxial layers in a controlled way. The underlying principle of these methods is to change the growth parameters during growth of an atomic layer in such a way that nucleation on top of a growing layer is suppressed, and thus, layer-by-layer growth is achieved. Experimentally, this can be realized by changing the substrate temperature or deposition rate during monolayer growth in a well-defined way. The same can be achieved at constant temperature and deposition rate by simultaneous ion bombardment during the early stages of growth of a monolayer, or by adding suitable surfactants to the system. Model experiments on Ag(lll) and on Cu(lll) using thermal energy atom scattering and scanning tunneling microscopy demonstrate the success of these methods.
引用
收藏
页码:455 / 466
页数:12
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