TEMPERATURE-DEPENDENCE OF PRESSURE-INDUCED WIDTH AND SHIFT OF ROTATIONAL LINES OF HCL

被引：32

作者：

VANAALST, RM ^{[1
]}

SCHUURMAN, JA ^{[1
]}

VANDERELSKEN, J ^{[1
]}

机构：

[1] UNIV AMSTERDAM,LAB PHYS CHEM,AMSTERDAM,NETHERLANDS

来源：

CHEMICAL PHYSICS LETTERS | 1975年 / 35卷 / 04期

关键词：

D O I：

10.1016/0009-2614(75)85667-3

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

页码：558 / 562

页数：5

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[6] DETERMINATION OF HALF-WIDTH AND INTENSITY OF A SPECTRAL-LINE BY METHOD OF NONLINEAR REGRESSION [J].

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[7] TEMPERATURE-DEPENDENCE OF PRESSURE-INDUCED WIDTH AND SHIFT OF FIRST HCL ROTATIONAL LINE [J].

VANAALST, RM ;

SPIEKERMAN, RJ ;

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PHYSICS LETTERS A, 1974, A 47 (06) :451-452

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