MICROANALYSIS OF LIGHT-ELEMENTS USING TRANSMITTED ENERGY-LOSS ELECTRONS

被引：234

作者：

ISAACSON, M

JOHNSON, D

机构：

[1] UNIV CHICAGO, DEPT PHYS, CHICAGO, IL 60637 USA

[2] UNIV CHICAGO, ENRICO FERMI INST, CHICAGO, IL 60637 USA

[3] UNIV WISCONSIN, HIGH VOLTAGE ELECTRON MICROSCOPE LAB, MADISON, WI 53706 USA

来源：

ULTRAMICROSCOPY | 1975年 / 1卷 / 01期

关键词：

D O I：

10.1016/S0304-3991(75)80006-4

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

页码：33 / 52

页数：20

共 43 条

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