THE MEASUREMENT OF NARROW DOMAIN-WALL WIDTHS IN SMCO5 USING DIFFERENTIAL PHASE-CONTRAST ELECTRON-MICROSCOPY

被引：16

作者：

MORRISON, GR

GONG, H

CHAPMAN, JN

HRNCIAR, V

机构：

[1] YUNAN UNIV, DEPT PHYS, KUNMING, PEOPLES R CHINA

[2] UNIV GLASGOW, DEPT PHYS & ASTRON, GLASGOW G12 8QQ, SCOTLAND

[3] SLOVAK UNIV TECHNOL BRATISLAVA, FAC MECH ENGN, DEPT TECHNOL & MAT, CS-83102 BRATISLAVA, CZECHOSLOVAKIA

来源：

JOURNAL OF APPLIED PHYSICS | 1988年 / 64卷 / 03期

关键词：

D O I：

10.1063/1.341856

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：1338 / 1342

页数：5

共 16 条

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ON THE USE OF DIVERGENT WALL IMAGES IN THE FRESNEL MODE OF LORENTZ MICROSCOPY FOR THE MEASUREMENT OF THE WIDTHS OF VERY NARROW DOMAIN-WALLS [J].

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