AN ULTRAHIGH-VACUUM SCANNING TUNNELING MICROSCOPE FOR SURFACE SCIENCE STUDIES

被引：70

作者：

ZEGLINSKI, DM ^{[1
]}

OGLETREE, DF ^{[1
]}

BEEBE, TP ^{[1
]}

HWANG, RQ ^{[1
]}

SOMORJAI, GA ^{[1
]}

SALMERON, MB ^{[1
]}

机构：

[1] UNIV CALIF BERKELEY LAWRENCE BERKELEY LAB,CTR ADV MAT,DIV MAT & CHEM SCI,BERKELEY,CA 94720

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 1990年 / 61卷 / 12期

关键词：

D O I：

10.1063/1.1141551

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

We describe the construction and operation of a scanning tunneling microscope designed in our laboratory that fits standard ultrahigh vacuum (UHV) systems as an add-on instrument. Sample motion is accomplished by electrical signals, eliminating mechanical feedthroughs. Samples are easily transferred to a modified Varian manipulator for heating and interfacing with other surface science techniques. In situ tip replacement and sample transfer in and out of the UHV system is also possible.

引用

页码：3769 / 3774

页数：6

共 23 条

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