VALENCE AND CONDUCTION-BAND ELECTRONIC DISTRIBUTIONS IN ION-BEAM PREPARED SAMPLES

被引：2

作者：

BELIN, E ^{[1
]}

TRAVERSE, A ^{[1
]}

SONDER, A ^{[1
]}

机构：

[1] CTR SPECTROMETRIE NUCL & SPECTROMETRIE MASSE,CNRS,IN2P3,F-91405 ORSAY,FRANCE

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 1993年 / 80-1卷

关键词：

D O I：

10.1016/0168-583X(93)96080-V

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

We report an experimental investigation of both valence and conduction electronic distributions in ion beam prepared samples using soft X-ray and X-ray photoelectron spectroscopies. Effects of atomic arrangements and composition are evidenced and discussed; insight is obtained regarding the electronic interactions in occupied or unoccupied bands and their possible modifications via implantation of impurities or irradiatiation. Our results indicate that the ion beam treated samples are particularly well suited for these spectroscopical analyses.

引用

页码：80 / 85

页数：6

共 23 条

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