SURFACE RECONSTRUCTION AND STABILIZATION IN MOMBE OF ZNSE REVEALED BY INSITU RHEED MONITORING

被引:12
作者
FUJITA, S
YOSHIMURA, N
WU, YH
FUJITA, S
机构
[1] Department of Electrical Engineering, Kyoto University, Kyoto
关键词
3;
D O I
10.1016/0022-0248(90)90940-M
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
Growth processes in MOMBE of ZnSe were characterized by in-situ RHEED monitoring. Se pretreatment of the substrate surface prior to the growth results in (2×1) reconstruction, which may originate from the GaSe bonds. After the growth starts, the VI/II ratio and the growth temperature must be low so that ridges are not formed initially. These pretreatments and growth conditions successfully avoid the interdiffusion of constituent elements at the ZnSe/GaAs heterointerface. During the epitaxial growth, Zn- and Se-stabilized surfaces take c(2×2) and (2×1) reconstruction patterns, respectively. Alternate irradiation of DMZn and DMSe results in an alternate change in the RHEED patterns, and layer-by-layer growth can be achieved by controlling the supply sequence according to the RHEED patterns. © 1989.
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页码:78 / 80
页数:3
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