THICKNESS EFFECTS IN ADF STEM ZONE-AXIS IMAGES

被引：55

作者：

HILLYARD, S

SILCOX, J

机构：

[1] School of Applied and Engineering Physics, Cornell University, Ithaca

来源：

ULTRAMICROSCOPY | 1993年 / 52卷 / 3-4期

基金：

美国国家科学基金会;

关键词：

D O I：

10.1016/0304-3991(93)90043-W

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

Quantitative measurements of intensities in annular dark field scanning transmission electron microscope images of (100) indium phosphide are reported. Fourier analysis of the experimental images gives the lattice fringe intensities which are related to the intensities of individual atomic columns. Electron energy loss measurements of the plasmon intensities provide a thickness. Analysis of simulated images for the same instrumental conditions provides a comparison that is consistent with an earlier prediction that electrons channel for considerably different distances along atomic columns of differing atomic number. This effect has considerable implications for image interpretation and analytical studies. The measurements indicate that reasonable partial coherence effects give rise to serious limitations on imaging at the highest resolution levels.

引用

页码：325 / 334

页数：10

共 39 条

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ALLDRED PJE, 1973, P ROY SOC LOND A MAT, V332, P239

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