SCANNING TUNNELING MICROSCOPE COMBINED WITH SCANNING ELECTRON-MICROSCOPE

被引：30

作者：

ICHINOKAWA, T ^{[1
]}

MIYAZAKI, Y ^{[1
]}

KOGA, Y ^{[1
]}

机构：

[1] JAPAN RES DEV CORP,TSUKUBA,IBARAGI 305,JAPAN

来源：

ULTRAMICROSCOPY | 1987年 / 23卷 / 01期

关键词：

D O I：

10.1016/0304-3991(87)90232-4

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

页码：115 / 118

页数：4

共 7 条

[1]

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[2]

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[3] ATOMIC FORCE MICROSCOPE [J].

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[4] TUNNELING THROUGH A CONTROLLABLE VACUUM GAP [J].

BINNIG, G ;

ROHRER, H ;

GERBER, C ;

WEIBEL, E .

APPLIED PHYSICS LETTERS, 1982, 40 (02) :178-180

[5] SURFACE STUDIES BY SCANNING TUNNELING MICROSCOPY [J].

BINNING, G ;

ROHRER, H ;

GERBER, C ;

WEIBEL, E .

PHYSICAL REVIEW LETTERS, 1982, 49 (01) :57-61

[6] SCANNING TUNNELING MICROSCOPE COMBINED WITH A SCANNING ELECTRON-MICROSCOPE [J].

GERBER, C ;

BINNIG, G ;

FUCHS, H ;

MARTI, O ;

ROHRER, H .

REVIEW OF SCIENTIFIC INSTRUMENTS, 1986, 57 (02) :221-224

[7]

WELLS OC, 1986, 44TH P ANN EMSA M AL, pE636

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