MAGNETIC DOMAIN CONTRAST IN BACKSCATTERED ELECTRON IMAGES OBTAINED WITH A SCANNING ELECTRON-MICROSCOPE

被引：17

作者：

YAMAMOTO, T ^{[1
]}

NISHIZAWA, H ^{[1
]}

TSUNO, K ^{[1
]}

机构：

[1] JEOL LTD,NAKAGAMI AKISHIMA,TOKYO 196,JAPAN

来源：

PHILOSOPHICAL MAGAZINE | 1976年 / 34卷 / 02期

关键词：

D O I：

10.1080/14786437608221945

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：311 / 325

页数：15

共 20 条

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[6] NEW METHOD OF OBSERVING MAGNETIC DOMAINS BY SCANNING ELECTRON-MICROSCOPY .2. EXPERIMENTAL CONFIRMATION OF THEORY OF IMAGE-CONTRAST [J].

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[7] NEW METHOD OF OBSERVING MAGNETIC DOMAINS BY SCANNING ELECTRON-MICROSCOPY .1. THEORY OF IMAGE-CONTRAST [J].

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[8]

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[9] DIRECT OBSERVATION OF MAGNETIC DOMAINS BY SCANNING ELECTRON MICROSCOPY [J].

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[10]

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