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PROPERTIES OF MZOS SURFACE-WAVE CONVOLVER CONFIGURATION
被引:9
作者
:
DAVIS, KL
论文数:
0
引用数:
0
h-index:
0
机构:
USN,RES INST,WASHINGTON,DC 20375
USN,RES INST,WASHINGTON,DC 20375
DAVIS, KL
[
1
]
机构
:
[1]
USN,RES INST,WASHINGTON,DC 20375
来源
:
IEEE TRANSACTIONS ON ELECTRON DEVICES
|
1976年
/ 23卷
/ 06期
关键词
:
D O I
:
10.1109/T-ED.1976.18451
中图分类号
:
TM [电工技术];
TN [电子技术、通信技术];
学科分类号
:
0808 ;
0809 ;
摘要
:
引用
收藏
页码:554 / 559
页数:6
相关论文
共 22 条
[1]
INVESTIGATION OF DEEP-DEPLETION REGIME OF MOS STRUCTURES USING RAMP-RESPONSE METHOD
BULUCEA, CD
论文数:
0
引用数:
0
h-index:
0
BULUCEA, CD
[J].
ELECTRONICS LETTERS,
1970,
6
(15)
: 479
-
+
[2]
EFFECT OF BIAS FIELD IN A ZINC-OXIDE-ON-SILICON ACOUSTIC CONVOLVER
COLDREN, LA
论文数:
0
引用数:
0
h-index:
0
机构:
BELL TEL LABS INC,HOLMDEL,NJ 07733
BELL TEL LABS INC,HOLMDEL,NJ 07733
COLDREN, LA
[J].
APPLIED PHYSICS LETTERS,
1974,
25
(09)
: 473
-
475
[3]
ZINC-OXIDE ON SILICON MEMORY CELLS SCANNED BY ACOUSTIC SURFACE-WAVES
COLDREN, LA
论文数:
0
引用数:
0
h-index:
0
机构:
BELL TEL LABS INC,HOLMDEL,NJ 07733
BELL TEL LABS INC,HOLMDEL,NJ 07733
COLDREN, LA
[J].
APPLIED PHYSICS LETTERS,
1975,
26
(04)
: 137
-
139
[4]
ZINC-OXIDE-ON-SILICON ACOUSTICALLY SCANNED IMAGER WITH POSITIVE SENSITIVITY AND STORAGE CAPABILITIES
COLDREN, LA
论文数:
0
引用数:
0
h-index:
0
机构:
BELL TEL LABS INC,HOLMDEL,NJ 07733
BELL TEL LABS INC,HOLMDEL,NJ 07733
COLDREN, LA
[J].
APPLIED PHYSICS LETTERS,
1975,
27
(01)
: 6
-
8
[5]
Cook C.E., 1967, RADAR SIGNALS
[6]
DARBY BJ, 1975, 1975 ULTR S P
[7]
DETERMINATION OF SEMICONDUCTOR SURFACE PROPERTIES USING SURFACE ACOUSTIC-WAVES
DAS, P
论文数:
0
引用数:
0
h-index:
0
机构:
RENSSELAER POLYTECH INST,ELECTR & SYST ENGN DEPT,TROY,NY 12181
RENSSELAER POLYTECH INST,ELECTR & SYST ENGN DEPT,TROY,NY 12181
DAS, P
MOTAMEDI, ME
论文数:
0
引用数:
0
h-index:
0
机构:
RENSSELAER POLYTECH INST,ELECTR & SYST ENGN DEPT,TROY,NY 12181
RENSSELAER POLYTECH INST,ELECTR & SYST ENGN DEPT,TROY,NY 12181
MOTAMEDI, ME
WEBSTER, RT
论文数:
0
引用数:
0
h-index:
0
机构:
RENSSELAER POLYTECH INST,ELECTR & SYST ENGN DEPT,TROY,NY 12181
RENSSELAER POLYTECH INST,ELECTR & SYST ENGN DEPT,TROY,NY 12181
WEBSTER, RT
[J].
APPLIED PHYSICS LETTERS,
1975,
27
(03)
: 120
-
122
[8]
STORAGE OF OPTICAL PATTERNS IN A ZINC-OXIDE-ON-SILICON SURFACE-WAVE CONVOLVER
DAVIS, KL
论文数:
0
引用数:
0
h-index:
0
机构:
USN,RES LAB,WASHINGTON,DC 20375
USN,RES LAB,WASHINGTON,DC 20375
DAVIS, KL
[J].
APPLIED PHYSICS LETTERS,
1975,
26
(04)
: 143
-
145
[9]
ZINC OXIDE SILICON MONOLITHIC ACOUSTIC SURFACE-WAVE OPTICAL IMAGE SCANNER
ELLIOTT, JK
论文数:
0
引用数:
0
h-index:
0
机构:
PURDUE UNIV,SCH ELECT ENGN,W LAFAYETTE,IN 47907
ELLIOTT, JK
GUNSHOR, RL
论文数:
0
引用数:
0
h-index:
0
机构:
PURDUE UNIV,SCH ELECT ENGN,W LAFAYETTE,IN 47907
GUNSHOR, RL
PIERRET, RF
论文数:
0
引用数:
0
h-index:
0
机构:
PURDUE UNIV,SCH ELECT ENGN,W LAFAYETTE,IN 47907
PIERRET, RF
DAVIS, KL
论文数:
0
引用数:
0
h-index:
0
机构:
PURDUE UNIV,SCH ELECT ENGN,W LAFAYETTE,IN 47907
DAVIS, KL
[J].
APPLIED PHYSICS LETTERS,
1975,
27
(04)
: 179
-
182
[10]
ELLIOTT JK, 1975, 1975 ULTR S P
←
1
2
3
→
共 22 条
[1]
INVESTIGATION OF DEEP-DEPLETION REGIME OF MOS STRUCTURES USING RAMP-RESPONSE METHOD
BULUCEA, CD
论文数:
0
引用数:
0
h-index:
0
BULUCEA, CD
[J].
ELECTRONICS LETTERS,
1970,
6
(15)
: 479
-
+
[2]
EFFECT OF BIAS FIELD IN A ZINC-OXIDE-ON-SILICON ACOUSTIC CONVOLVER
COLDREN, LA
论文数:
0
引用数:
0
h-index:
0
机构:
BELL TEL LABS INC,HOLMDEL,NJ 07733
BELL TEL LABS INC,HOLMDEL,NJ 07733
COLDREN, LA
[J].
APPLIED PHYSICS LETTERS,
1974,
25
(09)
: 473
-
475
[3]
ZINC-OXIDE ON SILICON MEMORY CELLS SCANNED BY ACOUSTIC SURFACE-WAVES
COLDREN, LA
论文数:
0
引用数:
0
h-index:
0
机构:
BELL TEL LABS INC,HOLMDEL,NJ 07733
BELL TEL LABS INC,HOLMDEL,NJ 07733
COLDREN, LA
[J].
APPLIED PHYSICS LETTERS,
1975,
26
(04)
: 137
-
139
[4]
ZINC-OXIDE-ON-SILICON ACOUSTICALLY SCANNED IMAGER WITH POSITIVE SENSITIVITY AND STORAGE CAPABILITIES
COLDREN, LA
论文数:
0
引用数:
0
h-index:
0
机构:
BELL TEL LABS INC,HOLMDEL,NJ 07733
BELL TEL LABS INC,HOLMDEL,NJ 07733
COLDREN, LA
[J].
APPLIED PHYSICS LETTERS,
1975,
27
(01)
: 6
-
8
[5]
Cook C.E., 1967, RADAR SIGNALS
[6]
DARBY BJ, 1975, 1975 ULTR S P
[7]
DETERMINATION OF SEMICONDUCTOR SURFACE PROPERTIES USING SURFACE ACOUSTIC-WAVES
DAS, P
论文数:
0
引用数:
0
h-index:
0
机构:
RENSSELAER POLYTECH INST,ELECTR & SYST ENGN DEPT,TROY,NY 12181
RENSSELAER POLYTECH INST,ELECTR & SYST ENGN DEPT,TROY,NY 12181
DAS, P
MOTAMEDI, ME
论文数:
0
引用数:
0
h-index:
0
机构:
RENSSELAER POLYTECH INST,ELECTR & SYST ENGN DEPT,TROY,NY 12181
RENSSELAER POLYTECH INST,ELECTR & SYST ENGN DEPT,TROY,NY 12181
MOTAMEDI, ME
WEBSTER, RT
论文数:
0
引用数:
0
h-index:
0
机构:
RENSSELAER POLYTECH INST,ELECTR & SYST ENGN DEPT,TROY,NY 12181
RENSSELAER POLYTECH INST,ELECTR & SYST ENGN DEPT,TROY,NY 12181
WEBSTER, RT
[J].
APPLIED PHYSICS LETTERS,
1975,
27
(03)
: 120
-
122
[8]
STORAGE OF OPTICAL PATTERNS IN A ZINC-OXIDE-ON-SILICON SURFACE-WAVE CONVOLVER
DAVIS, KL
论文数:
0
引用数:
0
h-index:
0
机构:
USN,RES LAB,WASHINGTON,DC 20375
USN,RES LAB,WASHINGTON,DC 20375
DAVIS, KL
[J].
APPLIED PHYSICS LETTERS,
1975,
26
(04)
: 143
-
145
[9]
ZINC OXIDE SILICON MONOLITHIC ACOUSTIC SURFACE-WAVE OPTICAL IMAGE SCANNER
ELLIOTT, JK
论文数:
0
引用数:
0
h-index:
0
机构:
PURDUE UNIV,SCH ELECT ENGN,W LAFAYETTE,IN 47907
ELLIOTT, JK
GUNSHOR, RL
论文数:
0
引用数:
0
h-index:
0
机构:
PURDUE UNIV,SCH ELECT ENGN,W LAFAYETTE,IN 47907
GUNSHOR, RL
PIERRET, RF
论文数:
0
引用数:
0
h-index:
0
机构:
PURDUE UNIV,SCH ELECT ENGN,W LAFAYETTE,IN 47907
PIERRET, RF
DAVIS, KL
论文数:
0
引用数:
0
h-index:
0
机构:
PURDUE UNIV,SCH ELECT ENGN,W LAFAYETTE,IN 47907
DAVIS, KL
[J].
APPLIED PHYSICS LETTERS,
1975,
27
(04)
: 179
-
182
[10]
ELLIOTT JK, 1975, 1975 ULTR S P
←
1
2
3
→