OBSERVATION OF X-RAY BRAGG-DIFFRACTION ON THE PERIODIC SURFACE RELIEF OF A PERFECT SILICON CRYSTAL

被引：20

作者：

ARISTOV, VV

ERKO, AI

NIKULIN, AY

SNIGIREV, AA

机构：

[1] USSR Acad of Sciences, Chernogolovka, USSR, USSR Acad of Sciences, Chernogolovka, USSR

来源：

OPTICS COMMUNICATIONS | 1986年 / 58卷 / 05期

关键词：

CRYSTALS - X-Ray Analysis - SILICON AND ALLOYS;

D O I：

10.1016/0030-4018(86)90230-0

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

Results are reported of the first experimental observation of X-ray diffraction on the artificial periodic surface relief of a single crystal under the conditions of the sample deviation from the exact Bragg angle. The angular width of the grating diffraction spectrum exceeded that of Bragg reflection.

引用

页码：300 / 302

页数：3