REPLICATION OF 0.1-MUM GEOMETRIES WITH X-RAY LITHOGRAPHY

被引:48
作者
FEDER, R [1 ]
SPILLER, E [1 ]
TOPALIAN, J [1 ]
机构
[1] IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY | 1975年 / 12卷 / 06期
关键词
D O I
10.1116/1.568532
中图分类号
O59 [应用物理学];
学科分类号
摘要
引用
收藏
页码:1332 / 1335
页数:4
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[3]   ABSOLUTE INTENSITY MEASUREMENTS OF THE CARBON AND ALUMINIUM X-RAY K-LINES WITH A PROPORTIONAL COUNTER [J].
DOLBY, RM .
BRITISH JOURNAL OF APPLIED PHYSICS, 1960, 11 (02) :64-66
[4]  
MAYDAN D, 1974, P INT ELECTRON DEVIC, P18
[5]  
SPEARS DL, 1972, SOLID STATE TECH JUL
[6]  
SPILLER E, TO BE PUBLISHED