X-RAY WAFER PROBE FOR TOTAL DOSE TESTING

[1] COMPUTATION OF BREMSSTRAHLUNG X-RAY-SPECTRA AND COMPARISON WITH SPECTRA MEASURED WITH A GE(LI) DETECTOR [J]. PHYSICS IN MEDICINE AND BIOLOGY, 1979, 24 (03) : 505 - 517

[2] PHOTOELECTRON EFFECTS ON THE DOSE DEPOSITED IN MOS DEVICES BY LOW-ENERGY X-RAY SOURCES [J]. IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1980, 27 (06) : 1465 - 1468

[3] MEASUREMENT AND CALCULATION OF ABSOLUTE INTENSITIES OF X-RAY-SPECTRA [J]. JOURNAL OF APPLIED PHYSICS, 1975, 46 (10) : 4537 - 4540

[4] EFFECT OF PHOTON ENERGY ON THE RESPONSE OF MOS DEVICES [J]. IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1981, 28 (06) : 4137 - 4141

[5] RADIATION HARDNESS OF LSI-VLSI FABRICATION PROCESSES [J]. IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1979, 26 (06) : 5053 - 5055

[6] STORM E, 1970, NUCLEAR DATA TABLE A, V7565

[1] COMPUTATION OF BREMSSTRAHLUNG X-RAY-SPECTRA AND COMPARISON WITH SPECTRA MEASURED WITH A GE(LI) DETECTOR [J]. PHYSICS IN MEDICINE AND BIOLOGY, 1979, 24 (03) : 505 - 517

[2] PHOTOELECTRON EFFECTS ON THE DOSE DEPOSITED IN MOS DEVICES BY LOW-ENERGY X-RAY SOURCES [J]. IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1980, 27 (06) : 1465 - 1468

[3] MEASUREMENT AND CALCULATION OF ABSOLUTE INTENSITIES OF X-RAY-SPECTRA [J]. JOURNAL OF APPLIED PHYSICS, 1975, 46 (10) : 4537 - 4540

[4] EFFECT OF PHOTON ENERGY ON THE RESPONSE OF MOS DEVICES [J]. IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1981, 28 (06) : 4137 - 4141

[5] RADIATION HARDNESS OF LSI-VLSI FABRICATION PROCESSES [J]. IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1979, 26 (06) : 5053 - 5055

[6] STORM E, 1970, NUCLEAR DATA TABLE A, V7565