DIRECT FREQUENCY MEASUREMENTS OF TRANSITIONS AT 520 THZ (576-NM) IN IODINE AND 260 THZ (1.15 MU-M) IN NEON

被引：60

作者：

POLLOCK, CR

JENNINGS, DA

PETERSEN, FR

WELLS, JS

DRULLINGER, RE

BEATY, EC

EVENSON, KM

机构：

来源：

OPTICS LETTERS | 1983年 / 8卷 / 03期

关键词：

D O I：

10.1364/OL.8.000133

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

引用

收藏

页码：133 / 135

页数：3

相关论文

共 12 条

[1] EXTENSION OF ABSOLUTE-FREQUENCY MEASUREMENTS TO THE VISIBLE - FREQUENCIES OF 10 HYPERFINE COMPONENTS OF IODINE
BAIRD, KM
EVENSON, KM
HANES, GR
JENNINGS, DA
PETERSEN, FR
[J]. OPTICS LETTERS, 1979, 4 (09) : 263 - 264
[2] HE-NE LASERS STABILIZED BY SATURATED ABSORPTION IN IODINE AT 612-NM
CEREZ, P
BRILLET, A
MANPICHOT, CN
FELDER, R
[J]. IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1980, 29 (04) : 352 - 354
[3] INTERNATIONAL INTERCOMPARISON OF WAVELENGTH OF IODINE-STABILIZED LASERS
CHARTIER, JM
HELMCKE, J
WALLARD, AJ
[J]. IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1976, 25 (04) : 450 - 453
[4] OPTICAL-TIME SCALE
CHEBOTAYEV, VP
[J]. JOURNAL DE PHYSIQUE, 1981, 42 (NC8): : 505 - 512
[5] ACCURATE ABSOLUTE FREQUENCY MEASUREMENTS ON STABILIZED CO2 AND HE-NE INFRARED-LASERS
CLAIRON, A
DAHMANI, B
RUTMAN, J
[J]. IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1980, 29 (04) : 268 - 272
[6] DIRECT FREQUENCY-MEASUREMENT OF THE I2-STABILIZED HE-NE 473-THZ (633-NM) LASER
JENNINGS, DA
POLLOCK, CR
PETERSEN, FR
DRULLINGER, RE
EVENSON, KM
WELLS, JS
HALL, JL
LAYER, HP
[J]. OPTICS LETTERS, 1983, 8 (03) : 136 - 138
[7] MEASUREMENT OF THE FREQUENCY OF THE 3.39-MU-M METHANE-STABILIZED LASER TO +/-3 PARTS IN 10-11
KNIGHT, DJE
EDWARDS, GJ
PEARCE, PR
CROSS, NR
[J]. IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1980, 29 (04) : 257 - 264
[8] POLLOCK CR, 1982, APPL PHYS B-PHOTO, V28, P308
[9] TUNABLE, CONTINUOUS-WAVE LASER ACTION USING (F2+)A CENTERS IN LITHIUM-DOPED KCL
SCHNEIDER, I
MARQUARDT, CL
[J]. OPTICS LETTERS, 1980, 5 (06) : 214 - 215
[10] LASER-TO-MICROWAVE FREQUENCY DIVISION USING SYNCHROTRON RADIATION
WINELAND, DJ
[J]. JOURNAL OF APPLIED PHYSICS, 1979, 50 (04) : 2528 - 2532