THE SIMULATION OF X-RAY TOPOGRAPHIC IMAGES

被引:14
作者
EPELBOIN, Y [1 ]
机构
[1] UNIV PARIS 07,F-75221 PARIS 05,FRANCE
来源
PROGRESS IN CRYSTAL GROWTH AND CHARACTERIZATION OF MATERIALS | 1987年 / 14卷
关键词
D O I
10.1016/0146-3535(87)90026-8
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
引用
收藏
页码:465 / 506
页数:42
相关论文
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