MULTIPLICATION PHENOMENON FOR FISSION FRAGMENT RESPONSE IN SEMICONDUCTOR DETECTORS

被引:15
作者
BRITT, HC
WEGNER, HE
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D O I
10.1063/1.1718525
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
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页码:627 / +
页数:1
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SCHMITT HW, 1961, B AM PHYS SOC, V6, P240