USE OF REDUCED PARAMETERS IN MANY-BEAM ELECTRON-DIFFRACTION THEORY

被引：9

作者：

JONES, IP ^{[1
]}

机构：

[1] UNIV BIRMINGHAM,DEPT PHYS MET & SCI MAT,POB 363,BIRMINGHAM B15 2TT,ENGLAND

来源：

PHILOSOPHICAL MAGAZINE | 1976年 / 33卷 / 02期

关键词：

D O I：

10.1080/00318087608225777

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：311 / 330

页数：20

共 24 条

[1]

Bethe H, 1928, ANN PHYS-BERLIN, V87, P55

[2] APPLICATIONS OF MANY BEAM SYSTEMATIC DIFFRACTION CONTRAST IN HIGH-VOLTAGE TRANSMISSION ELECTRON-MICROSCOPY [J].

CHEN, LJ ;

THOMAS, G .

PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1974, 25 (01) :193-204

[3]

COCKAYNE DJ, 1972, Z NATURFORSCH PT A, VA 27, P452

[4] INVESTIGATIONS OF DISLOCATION STRAIN FIELDS USING WEAK BEAMS [J].

COCKAYNE, DJ ;

RAY, ILF ;

WHELAN, MJ .

PHILOSOPHICAL MAGAZINE, 1969, 20 (168) :1265-&

[5] RELATIVISTIC HARTREE-FOCK X-RAY AND ELECTRON SCATTERING FACTORS [J].

DOYLE, PA ;

TURNER, PS .

ACTA CRYSTALLOGRAPHICA SECTION A-CRYSTAL PHYSICS DIFFRACTION THEORETICAL AND GENERAL CRYSTALLOGRAPHY, 1968, A 24 :390-&

[6]

GORINGE MJ, 1972, 5TH P EUR C EL MICR, V1, P538

[7]

HIRSCH PB, 1965, ELECTRON MICROSCOPY

[8] MULTIPLE-SCATTERING AND DYNAMICAL EFFECTS IN DIFFUSE ELECTRON-SCATTERING [J].

HOIER, R .

ACTA CRYSTALLOGRAPHICA SECTION A, 1973, A 29 (NOV1) :663-672

[9] DIFFRACTION CHANNELLING OF FAST ELECTRONS AND POSITRONS IN CRYSTALS [J].

HOWIE, A .

PHILOSOPHICAL MAGAZINE, 1966, 14 (128) :223-&

[10] DIFFRACTION CONTRAST OF ELECTRON MICROSCOPE IMAGES OF CRYSTAL LATTICE DEFECTS .2. DEVELOPMENT OF A DYNAMICAL THEORY [J].

HOWIE, A ;

WHELAN, MJ .

PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL AND PHYSICAL SCIENCES, 1961, 263 (1312) :217-+

← 1 2 3 →