ANALYSIS OF REFLECTOMETRY DENSITY PROFILE MEASUREMENTS IN JET

被引：59

作者：

SIPS, ACC

KRAMER, GJ

机构：

[1] JET Joint Undertaking, Abingdon

来源：

PLASMA PHYSICS AND CONTROLLED FUSION | 1993年 / 35卷 / 06期

关键词：

D O I：

10.1088/0741-3335/35/6/008

中图分类号：

O35 [流体力学]; O53 [等离子体物理学];

学科分类号：

070204 ; 080103 ; 080704 ;

摘要：

A multichannel microwave reflectometer system is used to measure the electron density profile at JET. A new measurement technique is described which gives continuous information on the electron density profile in time. Profile measurements using swept-frequency measurements are combined with accurate measurements of the evolution of the density using fixed-frequency operation. The analysis of the data can be carried out routinely for each discharge at JET. The method includes estimates for the uncertainties on the measurements, corrections for finite sweep on the data and relativistic effects. The results compare well with other measurements of the electron density in JET.

引用

页码：743 / 755

页数：13