INTERFEROMETRY ON WOLTER X-RAY OPTICS - A POSSIBLE APPROACH

被引:2
作者
GEARY, JM
机构
关键词
D O I
10.1117/12.7976937
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
引用
收藏
页码:217 / 221
页数:5
相关论文
共 12 条
[1]  
ASCHENBACH B, 1988, APPL OPTICS, V27, P1401
[2]  
CHOW W, 1983, P SOC PHOTO-OPT INS, V440, P99
[3]  
CHOW W, 1983, OPT LETT, V8
[4]  
GEARY J, 1989, OPT ENG, V28
[5]  
GEARY JM, 1987, OPT ENG, V26, P1225
[6]   NEW TEST FOR CYLINDRICAL OPTICS [J].
GEARY, JM ;
PARKER, LJ .
OPTICAL ENGINEERING, 1987, 26 (08) :813-820
[7]   PROCESSING OF INTERFEROMETRIC FRINGE SCANNER DATA FOR THE AXAF TMA X-RAY TELESCOPE [J].
GLENN, P ;
SARNIK, A .
APPLIED OPTICS, 1988, 27 (08) :1534-1538
[8]   AUTOMATED CYLINDRICAL POLISHING OF GRAZING-INCIDENCE X-RAY MIRRORS [J].
JONES, RA ;
GERIL, N .
OPTICAL ENGINEERING, 1982, 21 (06) :1051-1056
[9]  
LAWRENCE G, 1983, P SOC PHOTO-OPT INS, V440, P106
[10]  
SARNIK A, 1987, P SOC PHOTO-OPT INS, V830, P29