CHANGE IN DEVIATION PARAMETER ON CROSSING A PHASE OR TWIN BOUNDARY

被引:1
作者
WHITE, JR [1 ]
机构
[1] QUEEN MARY COLL,DEPT MAT,LONDON,ENGLAND
关键词
D O I
10.1007/BF00543700
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
引用
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页码:541 / 543
页数:3
相关论文
共 4 条
[1]   TRANSMISSION ELECTRON MICROSCOPY OF VANADIUM-SILICON (V3SI) AT LOW TEMPERATURES [J].
GORINGE, MJ ;
VALDRE, U .
PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL AND PHYSICAL SCIENCES, 1966, 295 (1441) :192-&
[2]  
HIRSCH PB, 1965, ELECTRON MICROSCOPY
[3]   REAL SPACE CRYSTALLOGRAPHY AND DEFECTS IN MOLECULAR-CRYSTALS [J].
JONES, W ;
WILLIAMS, JO .
JOURNAL OF MATERIALS SCIENCE, 1975, 10 (03) :379-386
[4]   ELECTRON IMAGING OF TWINS IN POLYETHYLENE CRYSTALS [J].
WHITE, JR .
JOURNAL OF MATERIALS SCIENCE, 1974, 9 (11) :1860-1866