HREM STUDY OF DISPERSOIDS IN CRYOMILLED OXIDE DISPERSION-STRENGTHENED MATERIALS

被引:29
作者
SUSEGG, O
HELLUM, E
OLSEN, A
LUTON, MJ
机构
[1] RAUFOSS A-S,N-2831 RAUFOSS,NORWAY
[2] EXXON RES & ENGN CO,ANNANDALE,NJ 08801
来源
PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES | 1993年 / 68卷 / 02期
关键词
D O I
10.1080/01418619308221210
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Thin platelets (dispersoids) only a few atomic layers thick formed in cryomilled oxide dispersion strengthened aluminium, have been investigated by high-resolution electron microscopy (HREM). In order to interpret the experimental images, computer simulations of HREM images based on different structure models have been carried out. The image simulations have been used to determine the composition and the structure of the dispersoids. Two types of dispersoids have been found: one type consists of a single layer of nitrogen with the nitrogen atoms in tetrahedral positions in aluminium, the other type consists of one single layer of oxygen with the oxygen atoms in octahedral positions in aluminium.
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页码:367 / 380
页数:14
相关论文
共 16 条
[1]   FOURIER IMAGES .1. THE POINT SOURCE [J].
COWLEY, JM ;
MOODIE, AF .
PROCEEDINGS OF THE PHYSICAL SOCIETY OF LONDON SECTION B, 1957, 70 (05) :486-+
[2]   THE SCATTERING OF ELECTRONS BY ATOMS AND CRYSTALS .1. A NEW THEORETICAL APPROACH [J].
COWLEY, JM ;
MOODIE, AF .
ACTA CRYSTALLOGRAPHICA, 1957, 10 (10) :609-619
[3]  
GLANVILL AR, 1985, AUST J PHYS, V39, P71
[4]   MATERIALS WITH FINE MICROSTRUCTURES BY ADVANCED POWDER-METALLURGY [J].
GUTMANAS, EY .
PROGRESS IN MATERIALS SCIENCE, 1990, 34 (04) :261-366
[5]  
HELLUM E, 1990, P ESA S ESTEC, P301
[6]  
IIJIMA S, 1978, J MICROSCOPY, V117, P347
[7]  
KRIVANEK OL, 1976, OPTIK, V45, P97
[8]  
LUTON MJ, 1988, P MRS S MULTICOMPONE
[9]   DISTINGUISHING DISSOCIATED GLIDE AND SHUFFLE SET DISLOCATIONS BY HIGH-RESOLUTION ELECTRON-MICROSCOPY [J].
OLSEN, A ;
SPENCE, JCH .
PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES, 1981, 43 (04) :945-965
[10]   X-RAY-DIFFRACTION IN GAMMA-ALUMINA WHISKERS [J].
SARASWATI, V ;
RAO, GVN .
JOURNAL OF CRYSTAL GROWTH, 1987, 83 (04) :606-609