BONDING MECHANISMS AND POINT-DEFECTS IN TIAL

被引:47
作者
FU, CL
YOO, MH
机构
[1] Metals and Ceramics Division, Oak Ridge National laboratory, Oak Ridge, TN 37831
关键词
BONDING CHARGE DENSITY; DEFECT FORMATION ENERGIES; DEFECT CONCENTRATIONS; STRUCTURAL VACANCIES; ANTISITE DEFECTS;
D O I
10.1016/0966-9795(93)90022-N
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
The bonding mechanism and point defect structure in TiAl were investigated using a first-principles quantum mechanical calculation. The most remarkable feature found in the calculated binding charge density is the polarization of the p-electron at the aluminum sites, which gives rise to a large bond bending force between the Ti and Al layers. For the point defects, the absence of structural vacancies is predicted in TiAl, and the deviations from stoichiometry are accommodated by the substitutional antisite defects on both sublattices. High vacancy formation energies are obtained, which are closely related to the strong Ti-Al bonding and the similar atomic radii of Ti and Al.
引用
收藏
页码:59 / 63
页数:5
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