IMPROVEMENT AND APPLICATION OF THE FOURIER-TRANSFORMED PATTERN FROM A SMALL AREA OF HIGH-RESOLUTION ELECTRON-MICROSCOPE IMAGES

被引：25

作者：

TOMITA, M

HASHIMOTO, H

IKUTA, T

ENDOH, H

YOKOTA, Y

机构：

来源：

ULTRAMICROSCOPY | 1985年 / 16卷 / 01期

关键词：

D O I：

10.1016/S0304-3991(85)80003-6

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

页码：9 / 18

页数：10

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