1/F NOISE AND OTHER SLOW, NONEXPONENTIAL KINETICS IN CONDENSED MATTER

[1] NOISE SIMULATIONS OF AN ISING-MODEL OF GLASSY KINETICS [J]. PHYSICAL REVIEW B, 1987, 36 (16) : 8429 - 8434

[2] ANOMALOUS LOW-TEMPERATURE THERMAL PROPERTIES OF GLASSES AND SPIN GLASSES [J]. PHILOSOPHICAL MAGAZINE, 1972, 25 (01): : 1 - &

[3] BAJAJ J, 1985, J VAC SCI TECHNOL, V31, P192

[4] SELF-ORGANIZED CRITICALITY - AN EXPLANATION OF 1/F NOISE [J]. PHYSICAL REVIEW LETTERS, 1987, 59 (04) : 381 - 384

[5] 1-F NOISE IN VARIANCE OF JOHNSON NOISE [J]. JOURNAL OF APPLIED PHYSICS, 1978, 49 (06) : 3384 - 3385

[6] Bell D., 1985, NOISE SOLID STATE, P35

[7] Bernamont J., 1937, ANN PHYS-BERLIN, V11, P71, DOI [10.1051/anphys/193711070071, DOI 10.1051/ANPHYS/193711070071]

[8] ANELASTIC PIEZORESISTANCE EFFECT IN ALLOYS [J]. PHILOSOPHICAL MAGAZINE, 1964, 9 (99): : 467 - &

[9] RESISTANCE FLUCTUATIONS IN THIN BI WIRES AND FILMS [J]. PHYSICAL REVIEW LETTERS, 1987, 58 (12) : 1240 - 1243

[10] ORIGIN OF BROAD-BAND NOISE IN CHARGE-DENSITY-WAVE CONDUCTORS [J]. PHYSICAL REVIEW LETTERS, 1985, 54 (22) : 2453 - 2456

[1] NOISE SIMULATIONS OF AN ISING-MODEL OF GLASSY KINETICS [J]. PHYSICAL REVIEW B, 1987, 36 (16) : 8429 - 8434

[2] ANOMALOUS LOW-TEMPERATURE THERMAL PROPERTIES OF GLASSES AND SPIN GLASSES [J]. PHILOSOPHICAL MAGAZINE, 1972, 25 (01): : 1 - &

[3] BAJAJ J, 1985, J VAC SCI TECHNOL, V31, P192

[4] SELF-ORGANIZED CRITICALITY - AN EXPLANATION OF 1/F NOISE [J]. PHYSICAL REVIEW LETTERS, 1987, 59 (04) : 381 - 384

[5] 1-F NOISE IN VARIANCE OF JOHNSON NOISE [J]. JOURNAL OF APPLIED PHYSICS, 1978, 49 (06) : 3384 - 3385

[6] Bell D., 1985, NOISE SOLID STATE, P35

[7] Bernamont J., 1937, ANN PHYS-BERLIN, V11, P71, DOI [10.1051/anphys/193711070071, DOI 10.1051/ANPHYS/193711070071]

[8] ANELASTIC PIEZORESISTANCE EFFECT IN ALLOYS [J]. PHILOSOPHICAL MAGAZINE, 1964, 9 (99): : 467 - &

[9] RESISTANCE FLUCTUATIONS IN THIN BI WIRES AND FILMS [J]. PHYSICAL REVIEW LETTERS, 1987, 58 (12) : 1240 - 1243

[10] ORIGIN OF BROAD-BAND NOISE IN CHARGE-DENSITY-WAVE CONDUCTORS [J]. PHYSICAL REVIEW LETTERS, 1985, 54 (22) : 2453 - 2456