HIGH BRILLIANCE BEAMLINE FOR TIME-RESOLVED X-RAY-ABSORPTION SPECTROSCOPY AT ESRF

被引：16

作者：

HAGELSTEIN, M ^{[1
]}

FONTAINE, A ^{[1
]}

GOULON, J ^{[1
]}

机构：

[1] LURE,CNRS,F-91405 ORSAY,FRANCE

来源：

JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS | 1993年 / 32卷

关键词：

X-RAY OPTICS; DISPERSIVE XAFS; TIME RESOLVED XAFS; TAPERED UNDULATOR;

D O I：

10.7567/JJAPS.32S2.240

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Beamline 8 at the ESRF equipped with a low K undulator, coupling x-ray optics and an energy dispersive XAFS spectrometer is under construction and shall be in operation by 1995. Undulator gap tuning and tapering the magnetic field by a linear variation of the undulator gap will be provided to choose the spectral characteristics for experiments at defined absorption edges. A flux of 10(12) photons per second on the sample within the total spectral range of 5 keV to 25 keV and a time resolution below 100 microseconds shall be reached. Small sample volumes can also be analyzed due to the high brilliance of the generated synchrotron radiation.

引用

页码：240 / 242

页数：3

共 15 条

[1]

ALLEN PG, 1992, SYNCHROTRON RAD NEWS, V5, P16

[2] PDA SYSTEM FOR ENERGY DISPERSIVE EXAFS [J].