WAVELENGTH MAPPING OF MIXED SEMICONDUCTORS USING AN AUTOMATIC IR SPECTROPHOTOMETER

被引：6

作者：

CAPPER, P ^{[1
]}

JONES, CL ^{[1
]}

KENWORTHY, I ^{[1
]}

BENNETT, MR ^{[1
]}

DAVIDSON, D ^{[1
]}

MCINTOSH, J ^{[1
]}

机构：

[1] EDINBURGH INSTRUMENTS LTD, EDINBURGH, SCOTLAND

来源：

INFRARED PHYSICS | 1984年 / 24卷 / 05期

关键词：

D O I：

10.1016/0020-0891(84)90008-3

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

引用

页码：473 / 481

页数：9

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