X-RAY TOMOGRAPHIC MICROSCOPY (XTM) USING SYNCHROTRON RADIATION

被引：216

作者：

KINNEY, JH ^{[1
]}

NICHOLS, MC ^{[1
]}

机构：

[1] SANDIA NATL LABS,DEPT MAT,LIVERMORE,CA 94551

来源：

ANNUAL REVIEW OF MATERIALS SCIENCE | 1992年 / 22卷

关键词：

TOMOGRAPHY; MICROTOMOGRAPHY; X-RAY IMAGING; RECONSTRUCTION FROM PROJECTIONS; X-RAY MICROSCOPY;

D O I：

10.1146/annurev.ms.22.080192.001005

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

[No abstract available]

引用

页码：121 / 152

页数：32

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