THICKNESS DEPENDENCE OF ELECTRODYNAMIC PROPERTIES OF TLCABACUO THIN-FILMS

被引：5

作者：

MARTENS, JS ^{[1
]}

HIETALA, VM ^{[1
]}

VENTURINI, EL ^{[1
]}

LEE, WY ^{[1
]}

机构：

[1] IBM CORP,ALMADEN RES CTR,SAN JOSE,CA 95120

来源：

JOURNAL OF APPLIED PHYSICS | 1993年 / 73卷 / 11期

关键词：

D O I：

10.1063/1.354008

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

The thickness dependence of electrodynamic properties of T12Ca2Ba2Cu3Ox films has been examined after correction for geometrical effects. The surface resistance increases for very thin or thick films as is consistent with the presence of a poorly superconducting layer (phase inclusions or morphology breakdown) as was detected with magnetization measurements. The temperature dependence of surface resistance has been examined at low temperatures and fitted to a multigap model. There was reasonable agreement for moderate thickness films, suggesting why such films have been and will be excellent for applications, while the behavior of other thicknesses may be dominated by grain boundaries.

引用

页码：7571 / 7574

页数：4

共 10 条

[1]

AHN BT, 1992, APPL PHYS LETT, V60, P1250

[2]

[Anonymous], PRINCIPLES SUPERCOND

[3] RF RESIDUAL LOSSES, SURFACE IMPEDANCE, AND GRANULARITY IN SUPERCONDUCTING CUPRATES [J].