SYSTEMATIC ERRORS IN DISLOCATION DENSITIES MEASURED BY THIN FILM ELECTRON MICROSCOPY

被引：6

作者：

FOXON, CTB

RIDER, JG

机构：

来源：

PHILOSOPHICAL MAGAZINE | 1966年 / 14卷 / 127期

关键词：

D O I：

10.1080/14786436608219000

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：185 / &

共 10 条

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[7] HIRSCH PB, 1963, C RELATION BETWEEN S, P39
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[9] AN EXPERIMENTAL DETERMINATION OF ELECTRICAL RESISTIVITY OF DISLOCATIONS IN ALUMINIUM
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[10] METHOD OF NEUTRAL PSEUDO-ATOMS IN THEORY OF METALS
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