X-RAY-METHOD FOR THE STRUCTURAL INVESTIGATION OF THIN ORGANIC FILMS

被引：22

作者：

RIEUTORD, F ^{[1
]}

BENATTAR, JJ ^{[1
]}

BOSIO, L ^{[1
]}

机构：

[1] UNIV PARIS 06,CNRS,PHYS LIQUIDES & ELECTROCHIM LAB,F-75230 PARIS 05,FRANCE

来源：

JOURNAL DE PHYSIQUE | 1986年 / 47卷 / 07期

关键词：

D O I：

10.1051/jphys:019860047070124900

中图分类号：

学科分类号：

摘要：

引用

页码：1249 / 1256

页数：8

共 11 条

[1]

BELBEOCH B, 1985, UNPUB THIN SOLID FIL

[2] APPARATUS FOR X-RAY REFLECTION MEASUREMENTS ON SOLID OR LIQUID SURFACES [J].

BOSIO, L ;

CORTES, R ;

FOLCHER, G ;

OUMEZINE, M .

REVUE DE PHYSIQUE APPLIQUEE, 1985, 20 (06) :437-443

[3] DESCRIPTIVE ANALYSIS OF THE CRYSTAL-STRUCTURE OF THE 1-D SEMICONDUCTING TCNQ SALT - TEA(TCNQ)2, AS A FUNCTION OF TEMPERATURE .1. INTERMOLECULAR DISTORTIONS OF THE CONDUCTING TCNQ COLUMNS [J].

FARGES, JP .

JOURNAL DE PHYSIQUE, 1985, 46 (03) :465-472

[4] DESCRIPTIVE ANALYSIS OF THE CRYSTAL-STRUCTURE OF THE 1-D SEMICONDUCTING TCNQ SALT - TEA(TCNQ)2, AS A FUNCTION OF TEMPERATURE .2. CHARGE-DISTRIBUTION ON THE CONDUCTING TCNQ COLUMNS [J].

FARGES, JP .

JOURNAL DE PHYSIQUE, 1985, 46 (07) :1249-1254

[5] ELECTRON-MICROSCOPY AND DIFFRACTION STUDY OF PHOSPHOLIPID MONOLAYERS TRANSFERRED FROM WATER TO SOLID SUBSTRATES [J].

FISCHER, A ;

SACKMANN, E .

JOURNAL DE PHYSIQUE, 1984, 45 (03) :517-527

[6] CHARACTERIZATION OF SURFACES BY GRAZING X-RAY REFLECTION - APPLICATION TO STUDY OF POLISHING OF SOME SILICATE-GLASSES [J].

NEVOT, L ;

CROCE, P .

REVUE DE PHYSIQUE APPLIQUEE, 1980, 15 (03) :761-779

[7] X-RAY-OBSERVATION OF A STACKED HEXATIC LIQUID-CRYSTAL B-PHASE [J].

PINDAK, R ;

MONCTON, DE ;

DAVEY, SC ;

GOODBY, JW .

PHYSICAL REVIEW LETTERS, 1981, 46 (17) :1135-1138

[8] X-RAY-DIFFRACTION STUDY OF THE INPLANE STRUCTURE OF AN ORGANIC MULTILAYER (LANGMUIR-BLODGETT) FILM [J].

PRAKASH, M ;

DUTTA, P ;

KETTERSON, JB ;

ABRAHAM, BM .

CHEMICAL PHYSICS LETTERS, 1984, 111 (4-5) :395-398

[9]

RUAUDELTEIXIER A, 1984, CR SOC FR CHIM

[10]

SARKAR M, 1983, THIN SOLID FILMS, V99

← 1 2 →