DETERMINATION OF IRON IN SEMICONDUCTOR-GRADE SILICON BY FURNACE ATOMIC-ABSORPTION SPECTROMETRY

被引：4

作者：

STEWART, DA

NEWTON, DC

机构：

来源：

ANALYST | 1983年 / 108卷 / 1293期

关键词：

D O I：

10.1039/an9830801450

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

引用

页码：1450 / 1458

页数：9

共 11 条

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[10] SOME SOURCES OF SYSTEMATIC-ERRORS IN DETERMINATION OF ELEMENTS IN NG-RANGE AND PG-RANGE BY ATOMIC-ABSORPTION SPECTROMETRY WITH FLAMELESS EXCITATION IN GRAPHITE OVEN [J].

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