THE REAL SPACE METHOD FOR DYNAMICAL ELECTRON-DIFFRACTION CALCULATIONS IN HIGH-RESOLUTION ELECTRON-MICROSCOPY .2. CRITICAL ANALYSIS OF THE DEPENDENCY ON THE INPUT PARAMETERS

被引：62

作者：

COENE, W

VANDYCK, D

机构：

[1] Univ Antwerpen, Antwerp, Belg, Univ Antwerpen, Antwerp, Belg

来源：

ULTRAMICROSCOPY | 1984年 / 15卷 / 1-2期

关键词：

D O I：

10.1016/0304-3991(84)90073-1

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

ELECTRONS

引用

页码：41 / 50

页数：10

共 20 条

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