EFFECT OF A VOLTAGE PROBE ON THE PHASE-COHERENT CONDUCTANCE OF A BALLISTIC CHAOTIC CAVITY

被引:50
作者
BROUWER, PW
BEENAKKER, CWJ
机构
[1] Instituut-Lorentz, University of Leiden, 2300 RA Leiden
关键词
D O I
10.1103/PhysRevB.51.7739
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The effect of an invasive voltage probe on the phase-coherent conduction through a ballistic chaotic cavity is investigated by random-matrix theory. The entire distribution P(G) of the conductance G is computed for the case that the cavity is coupled to source and drain by two point contacts with a quantized conductance of 2e2/h, both in the presence (=1) and absence (=2) of time-reversal symmetry. The loss of phase coherence induced by the voltage probe causes a crossover from P(G)G-1+/2 to a Gaussian centered at G=e2/h with a -dependent width. © 1995 The American Physical Society.
引用
收藏
页码:7739 / 7743
页数:5
相关论文
共 30 条
[1]   WEAK-LOCALIZATION AND INTEGRABILITY IN BALLISTIC CAVITIES [J].
BARANGER, HU ;
JALABERT, RA ;
STONE, AD .
PHYSICAL REVIEW LETTERS, 1993, 70 (25) :3876-3879
[2]   MESOSCOPIC TRANSPORT THROUGH CHAOTIC CAVITIES - A RANDOM S-MATRIX THEORY APPROACH [J].
BARANGER, HU ;
MELLO, PA .
PHYSICAL REVIEW LETTERS, 1994, 73 (01) :142-145
[3]   RESISTANCE FLUCTUATIONS IN MULTIPROBE MICROSTRUCTURES - LENGTH DEPENDENCE AND NONLOCALITY [J].
BARANGER, HU ;
STONE, AD ;
DIVINCENZO, DP .
PHYSICAL REVIEW B, 1988, 37 (11) :6521-6524
[4]  
BEENAKKER CWJ, 1991, SOLID STATE PHYS, V44, P1
[5]   CONDUCTANCE DISTRIBUTION OF A QUANTUM-DOT WITH NONIDEAL SINGLE-CHANNEL LEADS [J].
BROUWER, PW ;
BEENAKKER, CWJ .
PHYSICAL REVIEW B, 1994, 50 (15) :11263-11266
[6]  
BROUWER PW, UNPUB
[7]   SMALL NORMAL-METAL LOOP COUPLED TO AN ELECTRON RESERVOIR [J].
BUTTIKER, M .
PHYSICAL REVIEW B, 1985, 32 (03) :1846-1849
[8]   4-TERMINAL PHASE-COHERENT CONDUCTANCE [J].
BUTTIKER, M .
PHYSICAL REVIEW LETTERS, 1986, 57 (14) :1761-1764
[9]   COHERENT AND SEQUENTIAL TUNNELING IN SERIES BARRIERS [J].
BUTTIKER, M .
IBM JOURNAL OF RESEARCH AND DEVELOPMENT, 1988, 32 (01) :63-75
[10]   ROLE OF QUANTUM COHERENCE IN SERIES RESISTORS [J].
BUTTIKER, M .
PHYSICAL REVIEW B, 1986, 33 (05) :3020-3026