GRATINGS FOR METROLOGY AND PROCESS-CONTROL .1. A SIMPLE PARAMETER OPTIMIZATION PROBLEM

被引:13
作者
MENDES, GF
CESCATO, L
FREJLICH, J
机构
来源
APPLIED OPTICS | 1984年 / 23卷 / 04期
关键词
D O I
10.1364/AO.23.000571
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
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页码:571 / 575
页数:5
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  • [1] BALTES H, 1978, INVERSE SOURCE PROBL, P42
  • [2] BORN M, 1975, PRINCIPLES OPTICS, P630
  • [3] OPTICAL MONITORING OF THE ENDPOINT IN THIN-FILM PLASMA-ETCHING
    BRAGA, ES
    MENDES, GF
    FREJLICH, J
    MAMMANA, AP
    [J]. THIN SOLID FILMS, 1983, 109 (04) : 363 - 369
  • [4] INDEX AND SURFACE SIMULTANEOUS MODULATION IN NEGATIVE PHOTORESIST FILMS
    FREJLICH, J
    CLAIR, JJ
    [J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1977, 67 (12) : 1644 - 1650
  • [5] Goodman J. W, 2005, INTRO FOURIER OPTICS
  • [6] CONSTRUCTION OF GRATING PROFILES YIELDING PRESCRIBED DIFFRACTION EFFICIENCIES
    HUISER, AMJ
    QUATTROPANI, A
    BALTES, HP
    [J]. OPTICS COMMUNICATIONS, 1982, 41 (03) : 149 - 153
  • [7] LINEWIDTH MEASUREMENT ON IC MASKS AND WAFERS BY GRATING TEST PATTERNS
    KLEINKNECHT, HP
    MEIER, H
    [J]. APPLIED OPTICS, 1980, 19 (04): : 525 - 533
  • [8] KLEINKNECHT HP, 1978, J ELECTROCHEM SOC, V125, P798, DOI 10.1149/1.2131551
  • [9] OPTIMAL DESIGN FOR BEAM SAMPLING MIRROR GRATINGS
    LOEWEN, EG
    NEVIERE, M
    MAYSTRE, D
    [J]. APPLIED OPTICS, 1976, 15 (12): : 2937 - 2939
  • [10] DIFFRACTION ANALYSIS OF DIELECTRIC SURFACE-RELIEF GRATINGS
    MOHARAM, MG
    GAYLORD, TK
    [J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1982, 72 (10) : 1385 - 1392