INSTRUMENTAL REQUIREMENTS FOR HIGH-RESOLUTION IMAGING

[1] BALOSSIER G, 1980, 7TH P EUR C EL MICR, V1, P26

[2] BERNHARD W, 1980, OPTIK, V57, P73

[3] CLEAVER JRA, 1977, OPTIK, V48, P95

[4] CLEAVER JRA, 1980, ELECTRON MICROSC HAG, V1, P68

[5] ATOMIC RESOLUTION WITH A 600-KV ELECTRON-MICROSCOPE [J]. NATURE, 1979, 281 (5726) : 49 - 51

[6] DIETRICH J, 1976, SUPERCONDUCTING ELEC

[7] EFFECT OF STRAY MAGNETIC-FIELD ON IMAGE-RESOLUTION IN TRANSMISSION ELECTRON-MICROSCOPY [J]. ULTRAMICROSCOPY, 1980, 5 (03) : 351 - 356

[8] DUPOUY G, 1972, CR ACAD SCI B PHYS, V274, P1170

[9] GRONSKY R, 1980, 38TH P A M EL MICR S, P2

[10] THE ELECTRON OPTICAL SYSTEM OF THE ELECTRON MICROSCOPE [J]. JOURNAL OF SCIENTIFIC INSTRUMENTS, 1947, 24 (03): : 61 - 66

[1] BALOSSIER G, 1980, 7TH P EUR C EL MICR, V1, P26

[2] BERNHARD W, 1980, OPTIK, V57, P73

[3] CLEAVER JRA, 1977, OPTIK, V48, P95

[4] CLEAVER JRA, 1980, ELECTRON MICROSC HAG, V1, P68

[5] ATOMIC RESOLUTION WITH A 600-KV ELECTRON-MICROSCOPE [J]. NATURE, 1979, 281 (5726) : 49 - 51

[6] DIETRICH J, 1976, SUPERCONDUCTING ELEC

[7] EFFECT OF STRAY MAGNETIC-FIELD ON IMAGE-RESOLUTION IN TRANSMISSION ELECTRON-MICROSCOPY [J]. ULTRAMICROSCOPY, 1980, 5 (03) : 351 - 356

[8] DUPOUY G, 1972, CR ACAD SCI B PHYS, V274, P1170

[9] GRONSKY R, 1980, 38TH P A M EL MICR S, P2

[10] THE ELECTRON OPTICAL SYSTEM OF THE ELECTRON MICROSCOPE [J]. JOURNAL OF SCIENTIFIC INSTRUMENTS, 1947, 24 (03): : 61 - 66