SIMPLE, VARIABLE-TEMPERATURE, SCANNING TUNNELING MICROSCOPE

被引:13
作者
DUBSON, MA
HWANG, JS
机构
[1] MICHIGAN STATE UNIV,DEPT PHYS & ASTRON,E LANSING,MI 48824
[2] MICHIGAN STATE UNIV,CTR FUNDAMENTAL MAT RES,E LANSING,MI 48824
关键词
D O I
10.1063/1.1143590
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
We describe a simple scanning tunneling microscope (STM) which works well from room temperature to 4 K. It is relatively easy to build, repair, or modify, and works very reliably. An unusual feature of our STM is that it is assembled without glues or solders. A list of suppliers of the components used in our STM is included in the references.
引用
收藏
页码:3643 / 3645
页数:3
相关论文
共 6 条
[1]  
ANDERSON HL, 1981, PHYSICS VADE MECUM, P131
[2]   SCANNING TUNNELING MICROSCOPE FOR LOW-TEMPERATURE, HIGH MAGNETIC-FIELD, AND SPATIALLY RESOLVED SPECTROSCOPY [J].
FEIN, AP ;
KIRTLEY, JR ;
FEENSTRA, RM .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1987, 58 (10) :1806-1810
[3]  
KAISER WJ, 1987, SURF SCI, V182, pL227
[4]   LOW-TEMPERATURE ATOMIC FORCE MICROSCOPY [J].
KIRK, MD ;
ALBRECHT, TR ;
QUATE, CF .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1988, 59 (06) :833-835
[5]   ENERGY-GAP SPECTROSCOPY OF SUPERCONDUCTORS USING A TUNNELING MICROSCOPE [J].
LEDUC, HG ;
KAISER, WJ ;
STERN, JA .
APPLIED PHYSICS LETTERS, 1987, 50 (26) :1921-1923
[6]   VARIABLE-TEMPERATURE SCANNING TUNNELING MICROSCOPE [J].
LYDING, JW ;
SKALA, S ;
HUBACEK, JS ;
BROCKENBROUGH, R ;
GAMMIE, G .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1988, 59 (09) :1897-1902