A CONDENSER OBJECTIVE LENS WITH ASYMMETRIC POLEPIECES TO FACILITATE THE EXTRACTION OF SECONDARY AND AUGER ELECTRONS

被引:5
作者
BLEEKER, AJ
KRUIT, P
机构
[1] Delft University of Technology, 2628 CJ Delft
关键词
D O I
10.1063/1.1142126
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
A new condenser objective lens for a scanning transmission electron microscope especially designed for through-the-lens extraction of secondary and Auger electrons is presented. The optimal axial field to extract the secondary and Auger electrons is a field that falls off as 1/z2. This field form has been realized by a new lens design with one sharp polepiece and a second, carefully shaped, polepiece. This polepiece consists of two magnetically separated parts. The bore in this polepiece measures 20 mm while the working distance is 10 mm. The spherical aberration on the condenser side is 2.5 mm for an acceleration voltage of 125 kV while, with the same lens excitation, the projector side spherical and chromatic aberrations are 1.1 and 1.5 mm, respectively. All (Auger) electrons with an energy up to 1000 eV emerging from the specimen can be concentrated in a disk of 4.2 mm and a maximum opening angle of 6-degrees for further energy analysis.
引用
收藏
页码:350 / 356
页数:7
相关论文
共 16 条
[1]   THE MAGNETIC PARALLELIZER AS AN OPTICAL-ELEMENT FOR AUGER ELECTRONS - FURTHER CHARACTERIZATION [J].
BLEEKER, AJ ;
KRUIT, P .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 1990, 298 (1-3) :269-278
[2]  
BLEEKER AJ, 1986, BEDO19, P99
[3]  
BLEEKER AJ, 1989, ECASIA S248, P100
[4]  
DUBBELDAM L, 1989, THESIS DELFT U TECHN
[5]  
Glaser W., 1952, GRUNDLAGEN ELEKTRONE
[6]  
HAWKES PW, 1989, PRINCIPLES ELECTRON, V2, P639
[7]  
HEMBREE G, 1990, 12TH P INT C EL MICR, V2, P382
[8]   HIGH-SPATIAL-RESOLUTION SURFACE-SENSITIVE ELECTRON-SPECTROSCOPY USING A MAGNETIC PARALLELIZER [J].
KRUIT, P ;
VENABLES, JA .
ULTRAMICROSCOPY, 1988, 25 (03) :183-193
[9]   MAGNETIC-FIELD PARALLELIZER FOR 2-PI ELECTRONSPECTROMETER AND ELECTRON-IMAGE MAGNIFIER [J].
KRUIT, P ;
READ, FH .
JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1983, 16 (04) :313-324
[10]  
KRUIT P, IN PRESS