BANDGAP AND OPTICAL-TRANSITIONS IN THIN-FILMS FROM REFLECTANCE MEASUREMENTS

被引：265

作者：

BHATTACHARYYA, D

CHAUDHURI, S

PAL, AK

机构：

[1] Department of Materials Science, Indian Association for the Cultivation of Science, Calcutta

来源：

VACUUM | 1992年 / 43卷 / 04期

关键词：

D O I：

10.1016/0042-207X(92)90163-Q

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

A new formulation and method are presented for evaluating bandgap, optical transitions and optical constants from the reflectance data for films deposited onto a non-absorbing substrate.

引用

页码：313 / 316

页数：4

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