NEW TECHNIQUE TO MEASURE THE TOUGHNESS OF THIN-FILM INTERFACES

被引：21

作者：

GUPTA, V

PRONIN, A

机构：

[1] Thayer School of Engineering, Dartmouth College, Hanover, New Hampshire

来源：

JOURNAL OF THE AMERICAN CERAMIC SOCIETY | 1995年 / 78卷 / 05期

关键词：

D O I：

10.1111/j.1151-2916.1995.tb08503.x

中图分类号：

TQ174 [陶瓷工业]; TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

A new technique to measure the toughness of metal-ceramic interfaces is presented, In this technique, a test coating of 100 to 200 Angstrom is deposited on the substrate of interest. This layer is then overlaid by a residually stressed Nb coating (used as a loading device), and its thickness is controlled until the lower test layer buckles away from the substrate. By determining the intrinsic residual strain within the Nb layer in independent delamination experiments, the bilayer buckling morphology is quantified, and a measure of the interface fracture toughness is obtained. This technique has been successfully applied to interfaces between metallic coatings of Sb, Cr, Cu, Nb, Al, and substrates of sapphire with (0001) orientation. Interface toughness values of 0.31, 0.94, 0.93, 0.88, and 1.0 J/m(2) were obtained for these systems, respectively.

引用

页码：1397 / 1400

页数：4

共 8 条

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