ELECTRONIC-PROPERTIES OF COSI2 STUDIED BY REFLECTIVITY AND SPECTROSCOPIC ELLIPSOMETRY

被引：24

作者：

VIGUIER, C

CROS, A

HUMBERT, A

FERRIEU, C

THOMAS, O

MADAR, R

SENATEUR, JP

机构：

[1] ECOLE NATL SUPER INGN ELECT GRENOBLE,CNRS,UNITE 1109,F-38402 ST MARTIN DHERES,FRANCE

[2] CTR NATL ETUD TELECOMMUN,F-38243 MEYLAN,FRANCE

来源：

SOLID STATE COMMUNICATIONS | 1986年 / 60卷 / 12期

关键词：

D O I：

10.1016/0038-1098(86)90386-8

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

引用

页码：923 / 926

页数：4

共 17 条

[1] APPROXIMATE SOLUTION OF ELLIPSOMETRIC EQUATIONS FOR OPTICALLY BIAXIAL CRYSTALS [J].

ASPNES, DE .

JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1980, 70 (10) :1275-1277

[2]

BAUER RS, 1982, SURFACES INTERFACES

[3]

CALANDRA C, 1984, SURFACE SCI REPT, V4, P516

[4] DIELECTRIC FUNCTION OF MONOCRYSTALLINE MOSI2 BY SPECTROSCOPIC ELLIPSOMETRY [J].

GED, P ;

MADAR, R ;

SENATEUR, JP .

PHYSICAL REVIEW B, 1984, 29 (12) :6981-6984

[5]

HENRION W, 1982, PHYS STATUS SOLIDI B, V112, pK57, DOI 10.1002/pssb.2221120153

[6] TRANSISTOR ACTION IN SI/COSI2/SI HETEROSTRUCTURES [J].

HENSEL, JC ;

LEVI, AFJ ;

TUNG, RT ;

GIBSON, JM .

APPLIED PHYSICS LETTERS, 1985, 47 (02) :151-153

[7]

HUMBERT A, 1983, J PHYS LETT-PARIS, V44, pL929, DOI 10.1051/jphyslet:019830044023092900

[8] OPTICAL-CONSTANTS OF TRANSITION-METALS - TI, V, CR, MN, FE, CO, NI, AND PD [J].

JOHNSON, PB ;

CHRISTY, RW .

PHYSICAL REVIEW B, 1974, 9 (12) :5056-5070

[9]

PIZZI C, 1984, PHYS REV B, V29, P4

[10]

POATE JM, 1978, THIN FILM INTERDIFFU

← 1 2 →