REDUCTION IN RADIATION DAMAGE DUE TO CHANNELING OF 51-MEV IODINE IONS IN GOLD

被引:24
作者
NOGGLE, TS
OEN, OS
机构
关键词
D O I
10.1103/PhysRevLett.16.395
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
引用
收藏
页码:395 / +
页数:1
相关论文
共 25 条
[1]  
BASSETT GA, 1959, J I MET, V87, P449
[2]   EXPERIMENTAL EVIDENCE FOR THE EXTINCTION OF (P GAMMA) YIELDS IN SINGLE CRYSTALS [J].
BOGH, E ;
DAVIES, JA ;
NIELSEN, KO .
PHYSICS LETTERS, 1964, 12 (02) :129-130
[3]   EFFECT OF CHANNELING OF LOW-ENERGY PROTONS ON CHARACTERISTIC X-RAY PRODUCTION IN SINGLE CRYSTALS [J].
BRANDT, W ;
KHAN, JM ;
POTTER, DL ;
WORLEY, RD ;
SMITH, HP .
PHYSICAL REVIEW LETTERS, 1965, 14 (02) :42-&
[4]   ANISOTROPIC ENERGY LOSSES IN A FACE-CENTERED-CUBIC CRYSTAL FOR HIGH-ENERGY 79BR AND 127I IONS [J].
DATZ, S ;
NOGGLE, TS ;
MOAK, CD .
PHYSICAL REVIEW LETTERS, 1965, 15 (06) :254-+
[5]  
DATZ S, 1965, JUN P INT C EL ION S
[6]   RANGE OF ENERGETIC XE125 IONS IN MONOCRYSTALLINE SILICON [J].
DAVIES, JA ;
BROWN, F ;
BALL, GC ;
DOMEIJ, B .
CANADIAN JOURNAL OF PHYSICS, 1964, 42 (06) :1070-&
[7]   CHANNELLING OF IONS THROUGH SILICON DETECTORS [J].
DEARNALEY, G .
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1964, NS11 (03) :249-+
[8]   ANISOTROPIC ENERGY LOSS OF LIGHT PARTICLES OF MEV ENERGIES IN THIN SILICON SINGLE CRYSTALS [J].
ERGINSOY, C ;
GIBSON, WM ;
WEGNER, HE .
PHYSICAL REVIEW LETTERS, 1964, 13 (17) :530-&
[10]  
ERGINSOY C, 1965, B AM PHYS SOC, V10, P43