TOTAL REFLECTION X-RAY-FLUORESCENCE SPECTROMETRY - MATRIX REMOVAL PROCEDURES FOR TRACE ANALYSIS OF HIGH-PURITY SILICON, QUARTZ AND SULFURIC-ACID

被引：16

作者：

REUS, U

机构：

来源：

SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY | 1989年 / 44卷 / 05期

关键词：

D O I：

10.1016/0584-8547(89)80061-8

中图分类号：

O433 [光谱学];

学科分类号：

0703 ; 070302 ;

摘要：

引用

页码：533 / 541

页数：9

共 11 条

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[10] DETERMINATION OF TRACE-ELEMENTS IN THE WATER CYCLE BY TOTAL-REFLECTION X-RAY-FLUORESCENCE SPECTROMETRY [J].

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