GRAIN-BOUNDARIES MIGRATION INDUCED BY DIRECT-CURRENT

被引：7

作者：

LORMAND, G

ROUAIS, JC

EYRAUD, C

机构：

[1] INST NATL SCI APPL,LAB ETUD MAT,20 AVE ALBERT EINSTEIN,69621 VILLEURBANNE,FRANCE

[2] UNIV CLAUDE BERNARD,LAB CHIM APPL & GENIE CHIM,43 BLVD 11 NOVEMBRE 1918,69621 VILLEURBANNE,FRANCE

来源：

ACTA METALLURGICA | 1974年 / 22卷 / 06期

关键词：

D O I：

10.1016/0001-6160(74)90090-X

中图分类号：

TF [冶金工业];

学科分类号：

0806 ;

摘要：

引用

页码：793 / 799

页数：7

共 19 条

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[7]

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[8]

LORMAND G, 1967, MEM ETUD SCI REV MET, V64, P59

[9]

LORMAND G, 1965, CR HEBD ACAD SCI, V261, P1291

[10]

LORMAND G, 1970, THESIS LYON

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