THERMAL-STABILITY OF PT FILMS ON TIO2(110) - EVIDENCE FOR ENCAPSULATION

被引:221
作者
PESTY, F
STEINRUCK, HP
MADEY, TE
机构
[1] RUTGERS STATE UNIV, DEPT PHYS & ASTRON, PISCATAWAY, NJ 08855 USA
[2] RUTGERS STATE UNIV, SURFACE MODIFICAT LAB, PISCATAWAY, NJ 08855 USA
[3] UNIV PARIS 11, PHYS SOLIDES LAB, CNRS, F-91405 ORSAY, FRANCE
[4] UNIV WURZBURG, D-97074 WURZBURG, GERMANY
关键词
LOW ENERGY ION SCATTERING (LEIS); METALLIC FILMS; METAL-INSULATOR INTERFACES; PLATINUM; TITANIUM OXIDE; X-RAY PHOTOELECTRON SPECTROSCOPY;
D O I
10.1016/0039-6028(95)00605-2
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
We have studied the thermal stability of ultrathin platinum films on a rutile TiO2(110) surface, using low energy ion scattering (LEIS) and X-ray photoelectron spectroscopy (XPS). At room temperature, Pt grows in three-dimensional islands on the TiO2 surface, with little indication of an interface reaction. Upon annealing to temperatures above 450 K in UHV, encapsulation of the Pt islands by Ti suboxides is observed; the rate of this process increases with annealing temperature and decreases with island thickness. The Ti layer on top of the Pt islands is identified as a reduced Ti-n+ species (1 less than or equal to n less than or equal to 3) with the degree of reduction depending on the thickness of the Pt islands. These results are discussed in the framework of the strong metal-support interaction (SMSI) effect.
引用
收藏
页码:83 / 95
页数:13
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